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Chemical Physics LettersVolume 318, Issue 1-3, 18 February 2000, Pages 131-136

Nanoscale chemical analysis by tip-enhanced Raman spectroscopy(Article)

  • Stöckle, R.M.,
  • Suh, Y.D.,
  • Deckert, V.,
  • Zenobi, R.
  • Laboratorium für Organische Chemie, ETH Zürich, Universitätstrasse 16, Zürich, CH-8092, Switzerland

Abstract

A fine metal tip brought to within a few nanometers of a molecular film is found to give strong enhancement of Raman scattered light from the sample. This new principle can be used for molecular analysis with excellent spatial resolution, only limited by the tip apex size and shape. No special sample preparation is required, and the enhancement is identical at every sample location, allowing for quantitative surface-enhanced Raman spectroscopy measurements. When scanning the tip over the sample surface, topographic information is obtained simultaneously and can be directly correlated with the spectroscopic data.

Funding details

Funding numberFunding sponsorAcronymFunding opportunities
NFP 36
Schweizerischer Nationalfonds zur Förderung der Wissenschaftlichen ForschungSNFSee opportunities by SNF

  • 1

    We would like to thank L. Novotny for stimulating discussions and the Swiss Nanotechnology Program (NFP 36) managed by the Swiss National Science Foundation for financial support.

  • ISSN: 00092614
  • Source Type: Journal
  • Original language: English
  • DOI: 10.1016/S0009-2614(99)01451-7
  • Document Type: Article


© Copyright 2018 Elsevier B.V., All rights reserved.

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