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Materials TodayVolume 8, Issue 5, May 2005, Pages 50-54

Near-field Raman microscopy(Article)(Open Access)

  • aInstitute of Optics, University of Rochester, Rochester, NY 14627, United States
  • bPhysikalische Chemie, Universität Siegen, 57068 Siegen, Germany

Abstract

The use of sharp Au tips in an on-axis illumination scheme as a means to produce highly confined fields was presented. A near-field Raman imaging system and spectroscopy with examples from mapping vibrational modes along individual single-walled carbon nanotubes (SWNT) was also presented. A linearly polarized Gaussian mode form a continuous-wave He-Ne laser operating at 633 nm was also used. A sample containing a dispersion of individual and small bundles of SWNT with a lateral resolution of 275 nm in ∼λ/2.5, and 11 nm in ∼λ/60 was observed.

Indexed keywords

Engineering controlled terms:Electric fieldsImage processingLaser beamsMolecular vibrationsNatural frequenciesNear field scanning optical microscopyPhotonsQuantum theoryRaman scatteringSignal processingX rays
Engineering uncontrolled terms:Compton scatteringNear-field Raman microscopySignal transmissionTip-enhanced, near-field scanning optical microscopy (TE-NSOM)
Engineering main heading:Raman spectroscopy

Funding details

Funding numberFunding sponsorAcronymFunding opportunities
Harvard University
Air Force Office of Scientific ResearchAFOSRSee opportunities by AFOSR
F-49620-03-0397

  • 1

    The authors are grateful to Steve Cronin at Harvard University for providing CVD-grown SWNT samples. We would like to acknowledge financial support under MURI grant F-49620-03-0397 (Air Force Office for Scientific Research).

  • ISSN: 13697021
  • Source Type: Journal
  • Original language: English
  • DOI: 10.1016/S1369-7021(05)00846-1
  • Document Type: Article

  Anderson, N.; Institute of Optics, University of Rochester, United States;
© Copyright 2008 Elsevier B.V., All rights reserved.

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