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Faraday DiscussionsVolume 132, 2006, Pages 215-225

Nanoscale imaging of carbon nanotubes using tip enhanced Raman spectroscopy in reflection mode(Conference Paper)

  • aNanoscience Centre, University of Cambridge, 11 J J Thomson Ave., West Cambridge, Cambridge, CB3 0FF, United Kingdom
  • bNational Physical Laboratory, Hampton Road, Teddington, TW11 0LW, United Kingdom
  • cNational Physical Laboratory, Hampton Road, Teddington, TW110 LW, United Kingdom

Abstract

An apertureless tip enhanced Raman spectrometer in reflection mode geometry is demonstrated. A spatial resolution as small as 30 nm was achieved. This was implemented by placing a sharp gold tip near the single wall carbon nanotubes using an atomic force microscope (AFM). The tip was illuminated from the same side of the sample which eliminated the need for a transparent substrate. The tip was maintained at a distance of a few nanometers using a quartz tuning fork. The Raman signal was collected from the G peak of the single wall carbon nanotubes using a single photon detecting module and topography image was acquired by the AFM. © The Royal Society of Chemistry 2005.

  • ISSN: 13596640
  • Source Type: Journal
  • Original language: English
  • DOI: 10.1039/b506365e
  • Document Type: Conference Paper

  Roy, D.; National Physical Laboratory, Hampton Road, United Kingdom;
© Copyright 2006 Elsevier B.V., All rights reserved.

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