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Applied Physics LettersVolume 91, Issue 12, 2007, Article number 121101

Confinement of enhanced field investigated by tip-sample gap regulation in tapping-mode tip-enhanced Raman microscopy(Article)

  • aDepartment of Applied Physics, Osaka University, Suita, Osaka 565-0871, Japan
  • bRIKEN, Wako, Saitama 351-0198, Japan
  • cGraduate School of Frontier Biosciences, Osaka University, Suita, Osaka 565-0871, Japan
  • dCREST, Japan Corporation of Science and Technology (JST), Kawaguchi 322-0012, Japan

Abstract

The authors developed a tip-enhanced near field Raman microscope that can precisely regulate longitudinal distance between a metallic tip and sample molecules. This was done by employing a time-gated photoncounting scheme that enabled us to observe exponentially decaying near field Raman intensity with the tip-sample distance. The exponential decay shows a characteristic of the enhanced field generated by the localization of the surface plasmon polaritons near the tip apex. This microscope was applied to evaluate metal-coated tips and also to investigate confinement of the field generated at a gap between two metal nanostructures from the decay curves. © 2007 American Institute of Physics.

Indexed keywords

Engineering controlled terms:Coated materialsDistance measurementNanostructuresPhotoconducting devicesRaman scattering
Engineering uncontrolled terms:Raman intensitySurface plasmon polaritonsTip enhanced Raman microscopy
Engineering main heading:Microscopic examination
  • ISSN: 00036951
  • CODEN: APPLA
  • Source Type: Journal
  • Original language: English
  • DOI: 10.1063/1.2785115
  • Document Type: Article

  Yano, T.-A.; Department of Applied Physics, Osaka University, Japan
© Copyright 2008 Elsevier B.V., All rights reserved.

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