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NanotechnologyVolume 19, Issue 21, 28 May 2008, Article number 215702

Light depolarization induced by metallic tips in apertureless near-field optical microscopy and tip-enhanced Raman spectroscopy(Article)

  • aCNR - Istituto Per I Processi Chimico-Fisici, Sezione Messina, Salita Sperone, Contrada Papardo, I-98158 Faro Superiore, Messina, Italy
  • bInstitut Charles Delaunay - CNRS FRE 2848, Laboratoire de Nanotechnologie et d'Instrumentation Optique, Université de Technologie de Troyes, 12 rue Marie Curie, 10010 Troyes, France

Abstract

We have investigated the depolarization effects of light scattered by sharp tips used for apertureless near-field optical microscopy. Dielectric and metal coated tips have been investigated and depolarization factors between 5 and 30% have been measured, changing as a function of the incident light polarization and of the tip shape. The experimental results are in good agreement with theoretical calculations performed by the finite element method, giving a near-field depolarization factor close to 10%. The effect of depolarization has been investigated in polarized tip-enhanced Raman spectroscopy (TERS) experiments; the depolarization gives rise to forbidden Raman modes in Si crystals. © IOP Publishing Ltd.

Indexed keywords

Engineering controlled terms:Crystal structureFinite element methodLight polarizationLight scatteringOptical microscopyRaman spectroscopy
Engineering uncontrolled terms:Apertureless near-field optical microscopyDepolarization effectsLight depolarizationMetallic tips
Engineering main heading:Depolarization
EMTREE drug terms:metal
EMTREE medical terms:articlelight scatteringpolarizationpriority journalRaman spectrometryscanning near field optical microscopytheoretical modeltip enhanced raman spectroscopy
  • ISSN: 09574484
  • CODEN: NNOTE
  • Source Type: Journal
  • Original language: English
  • DOI: 10.1088/0957-4484/19/21/215702
  • Document Type: Article

  Gucciardi, P. G.; CNR - Istituto Per I Processi Chimico-Fisici, Sezione Messina, Salita Sperone, Contrada Papardo, Italy
© Copyright 2008 Elsevier B.V., All rights reserved.

Cited by 33 documents

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