

The authors report on a simple method of fabricating gold tips, suitable for use in a shear-force mode atomic force microscope for tip-enhanced Raman spectroscopy (TERS). The proposed electrochemical method is highly optimized and offers five advantages: produces a low-aspect ratio tip that can withstand the lateral force at the end of the tip during scanning, produces a sharp tip end to generate good Raman enhancements for TERS, a self-terminating process that makes the etching process easy, use of inexpensive electronic systems so that it can be adopted by any laboratory, and less time consuming (takes less than 20 s to fabricate a single tip). This article demonstrates TERS imaging using such tips. © 2008 American Vacuum Society.
| Engineering controlled terms: | Architectural acousticsAspect ratioFabricationRaman scatteringRaman spectroscopySpectrum analysis |
|---|---|
| Engineering uncontrolled terms: | Atomic Force MicroscopeElectro-chemical methodElectronic systemsEtching processesLateral forcesSharp tipSimple methodsTime consumingTip-enhanced Raman Spectroscopy |
| Engineering main heading: | Atomic spectroscopy |
| Funding number | Funding sponsor | Acronym | Funding opportunities |
|---|---|---|---|
| National Physical Laboratory | NPL |
The authors gratefully acknowledge the help of Gareth Hind for voltammogram measurements. This work at the National Physical Laboratory was funded by the Strategic Research Committee.
Roy, D.; National Physical Laboratory, United Kingdom;
© Copyright 2008 Elsevier B.V., All rights reserved.