

The characteristics of energy spectra and dynamics of surface energy states (SES) on silicon were investigated using the photoacoustic (PA) method. The measured PA spectra was used to study the silicon samples of various surface quality. The difference in the PA amplitude spectra of a silicon wafer and a mechanically roughened wafer resulted in the energy distribution and SES dynamics.
| Engineering controlled terms: | Electron energy levelsInterfacial energyLaser beam effectsLight absorptionLight reflectionOptical beam splittersPlasma wavesSilicon wafersSpectrum analysisSurface roughnessThermal diffusionThermoelasticity |
|---|---|
| Engineering uncontrolled terms | Modulation frequenciesSurface energy states (SES) |
| Engineering main heading: | Photoacoustic effect |
Todorović, D.M.; Center for Multidisciplinary Studies, University of Belgrade, P.O. Box 33, Serbia;
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