Dielectric and ferroelectric properties of multilayer BaTiO3/NiFe2O4 thin films prepared by solution deposition technique(Article)
- aBioSense Institute, University of Novi Sad, Dr Zorana Đinđića 1, Novi Sad, 21000, Serbia
- bDepartment of Materials Engineering, Faculty of Technology Novi Sad, University of Novi Sad, Bul. Cara Lazara 1, Novi Sad, 21000, Serbia
- cDepartment of Electronics, Faculty of Technical Sciences, University of Novi Sad, Trg D. Obradovića 6, Novi Sad, 21000, Serbia
- dFaculty of Physics, Vilnius University, Saulėtekio av. 9, III b, Vilnius, LT-10222, Lithuania
- eInstitute for Multidisciplinary Research, University of Belgrade, Kneza Višeslava 1, Serbia
Abstract
In this work different lead-free multilayered structures, composed of perovskite BaTiO3 and spinel NiFe2O4 thin layers, were obtained by solution deposition method. Structural characterization of the sintered thin films confirmed the well-defined layered structure with overall thickness from 160 to 600 nm, crystalline nature of perovskite BaTiO3 and spinel NiFe2O4 phases without secondary phases (after sintering below 900 °C) and grains on nanometer scale. Dielectric properties of the multiferroic multilayer BaTiO3/NiFe2O4 thin films were analyzed in temperature and frequency range from 30 °C to 200 °C and 100 Hz to 1 MHz, respectively. In comparison to the pure BaTiO3 films, the introduction of ferrite layer reduces dielectric response and increases low frequency permittivity dispersion of the multilayer thin films. The multilayer samples have shown relatively low dielectric loss with stronger contribution of conductivity at higher temperatures, and characteristic broad peak representing “relaxation” of the interface charge accumulation. © 2022 Elsevier Ltd and Techna Group S.r.l.
Indexed keywords
| Engineering controlled terms: | Barium titanateDepositionDielectric lossesFerroelectric filmsFilm preparationIron compoundsMultilayer filmsMultilayersPermittivityPerovskiteSintering |
|---|---|
| Engineering uncontrolled terms | BaTiO3/nife2O4Dielectric and ferroelectric propertiesDielectrics propertyLead-FreeMulti-layer thin filmMulti-layered structureSolution depositionSolution deposition techniquesThin layersThin-films |
| Engineering main heading: | Nickel compounds |
Funding details
| Funding sponsor | Funding number | Acronym |
|---|---|---|
| 451-03-68/2022-14/200134 | ||
| European Cooperation in Science and Technology | CA17123 | COST |
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1
The authors gratefully acknowledge the financial support provided by the Ministry of Science of the Republic of Serbia , project 451-03-68/2022-14/200134, COST Project CA17123, and professor Branko Skoric for the AFM measurements.
- ISSN: 02728842
- CODEN: CINND
- Source Type: Journal
- Original language: English
- DOI: 10.1016/j.ceramint.2022.05.326
- Document Type: Article
- Publisher: Elsevier Ltd
Bajac, B.; University of Novi Sad, Dr Zorana Đinđića 1, Novi Sad, Serbia;
© Copyright 2022 Elsevier B.V., All rights reserved.
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