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ACS Applied Materials and InterfacesVolume 15, Issue 37, 20 September 2023, Pages 44482-44492

Robust SrTiO3 Passivation of Silicon Photocathode by Reduced Graphene Oxide for Solar Water Splitting(Article)(Open Access)

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  • aAdvanced Materials Department, Jožef Stefan Institute, Ljubljana, 1000, Slovenia
  • bDepartment of Materials Chemistry, National Institute of Chemistry, Ljubljana, 1000, Slovenia
  • cLaboratory of Physics, Vinča Institute of Nuclear Sciences, National Institute of the Republic of Serbia, University of Belgrade, Belgrade, 11351, Serbia
  • dDepartment of Thin Films and Surfaces, Jožef Stefan Institute, Ljubljana, 1000, Slovenia
  • eDepartment of Surface Engineering, Jožef Stefan Institute, Ljubljana, 1000, Slovenia
  • fMESA+ Institute for Nanotechnology, University of Twente, NB, Enschede, 7522, Netherlands
  • gDepartment of Dielectrics, Institute of Physics, Czech Academy of Sciences, Prague, 182 00, Czech Republic

Abstract

Development of a robust photocathode using low-cost and high-performing materials, e.g., p-Si, to produce clean fuel hydrogen has remained challenging since the semiconductor substrate is easily susceptible to (photo)corrosion under photoelectrochemical (PEC) operational conditions. A protective layer over the substrate to simultaneously provide corrosion resistance and maintain efficient charge transfer across the device is therefore needed. To this end, in the present work, we utilized pulsed laser deposition (PLD) to prepare a high-quality SrTiO3 (STO) layer to passivate the p-Si substrate using a buffer layer of reduced graphene oxide (rGO). Specifically, a very thin (3.9 nm ∼10 unit cells) STO layer epitaxially overgrown on rGO-buffered Si showed the highest onset potential (0.326 V vs RHE) in comparison to the counterparts with thicker and/or nonepitaxial STO. The photovoltage, flat-band potential, and electrochemical impedance spectroscopy measurements revealed that the epitaxial photocathode was more beneficial for charge separation, charge transfer, and targeted redox reaction than the nonepitaxial one. The STO/rGO/Si with a smooth and highly epitaxial STO layer outperforming the directly contacted STO/Si with a textured and polycrystalline STO layer showed the importance of having a well-defined passivation layer. In addition, the numerous pinholes formed in the directly contacted STO/Si led to the rapid degradation of the photocathode during the PEC measurements. The stability tests demonstrated the soundness of the epitaxial STO layer in passivating Si against corrosion. This study provided a facile approach for preparing a robust protection layer over a photoelectrode substrate in realizing an efficient and, at the same time, durable PEC device. © 2023 The Authors. Published by American Chemical Society.

Author keywords

epitaxyonset potentialphotoelectrochemical water splittingprotection layerpulsed laser depositionreduced graphene oxideSrTiO3stability

Indexed keywords

Engineering controlled terms:Buffer layersCharge transferCorrosion resistanceElectrochemical impedance spectroscopyEpitaxial growthGraphenePassivationPhotocathodesPhotoelectrochemical cellsPulsed lasersRedox reactionsSiliconSilicon compoundsStrontium titanatesSubstratesTexturesTitanium compounds
Engineering uncontrolled termsAmerican Chemical SocietyLow-costsLow-highOnset potentialPhotoelectrochemical water splittingProtection layersPulsed-laser depositionReduced graphene oxidesSolar water splittingSrTiO 3
Engineering main heading:Pulsed laser deposition

Funding details

Funding sponsor Funding number Acronym
21-20110K
Javna Agencija za Raziskovalno Dejavnost RSN2-0187ARRS
  • 1

    The work was supported by the Slovenian Research Agency (Project No. N2-0187), the Czech Science Foundation 707 (Project No. 21-20110K), and the Slovenia - Serbia bilateral collaboration (Project “Photoelectrochemical Hydrogen Evolution from Epitaxial Silicon-Oxide Heterostructures (H2EPI)”). The authors also acknowledge the support from Mr. Damjan Vengust for the electron microscopy observations, Mr. Blaž Jaklič for the XPS analysis, Mr. Jožko Fišer for the Pt thin-film preparation, Dr. Vasko Jovanovski for the discussion of electrochemical measurements, and Dr. Špela Kunej for the UV–vis spectroscopy measurement.

  • ISSN: 19448244
  • Source Type: Journal
  • Original language: English
  • DOI: 10.1021/acsami.3c07747
  • PubMed ID: 37695941
  • Document Type: Article
  • Publisher: American Chemical Society

  Ho, H.-C.; Advanced Materials Department, Jožef Stefan Institute, Ljubljana, Slovenia;
  Spreitzer, M.; Advanced Materials Department, Jožef Stefan Institute, Ljubljana, Slovenia;
© Copyright 2023 Elsevier B.V., All rights reserved.

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